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Atomic Force Microscopy has become a valuable tool not only for imaging surfaces but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems should be properly calibrated.

We offer a range of calibration samples and tipcheck samples with a variety of geometries for calibration of different aspects of the AFM scanner including:

  • Lateral (XY) and vertical (Z) scanner calibration
  • Determination of the tip aspect ratio
  • Detection of lateral non-linearity, hysteresis, creep and cross-coupling effects
  • Determination of tip shape
  • Analysis of scanner bow

Follow the links below for technical details and pricing:

  • 20nm Height Calibration Standard: HS-20MG
  • 100nm Height Calibration Standard: HS-100MG
  • 500nm Height Calibration Standard: HS-500MG
  • Advanced XYZ Nanogrid Calibration Standard: CS-20NG
  • Tipcheck – AFM tip characterization sample

Follow the links below for technical details and pricing:

  • XYZ calibration standards: TGXYZ01TGXYZ02TGXYZ03
  • Later force calibration standard: TGF11
  • Tip Aspect Ration determination standard: TGX
  • Highly Ordered Pyrolytic Graphite (HOPG): ZYAZYBZYH
  • AFM tip characterization sample: PA01

Follow the links below for technical details and pricing:

  • Lateral-(xy)-Calibration Standard: 2D200
  • Flatness Standard: FLAT
  • Step Height Standard: H8

Follow the links below for technical details and pricing:

  • ISNE – “NanoEdge” Structure – Probe Tip Characteriser
  • IVPS – Vertical Parallel Structure – Probe Tip Characteriser
  • IFSR – Overhang Structure – Probe Tip Characteriser
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